Scanning Electron Microscopy (SEM)
Rapid, reliable answers to materials science and biological applications questions
| Overview |
- Particle Sizing & Counting
- Environmental samples
- Process control
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- Materials analysis
- Signature analysis
- Contaminant ID
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Working with clients from the biotech, semiconductor, specialty filament and other
industries, our experienced microscopists count, size, fingerprint and map samples to
solve materials science and biological applications problems. We’re ready to help
you, too.
| Imaging and Spectroscopy Services |
- Secondary Electron Imaging (SEI)
Low energy secondary electrons, provide high-resolution photomicrographs of the
surface features of samples ranging in diameter from submicron to several millimeters.
- Backscattered Electron Imaging (BEI)
Elemental anomalies in samples can be identified by BEI. Atomic contrast allows
visualization of the relative concentrations of different elements in a sample.
- Energy Dispersive Spectreroscopy (EDS)
EDS generates an elemental profile of a sample or section of a sample by spectral
resolution. This documents the presence or absence of specific elements in the sample.
- Advanced Image Analysis
Once an anomaly has been located by BEI, we can perform an EDS on that section of the
sample and plot the resulting data on an SEI photomicrograph. This technique is called
Advanced Image Analysis.
- Specialized Sample Preparation
Our analysts can prepare samples of almost any matrix for SEM/EDS. This capability, along
with our specialized equipment (large stage opening, high tilt angle, etc.) allows us to
process a wide variety of samples for any combination of the above services.
- Particle Sizing and Counting
We count and size particles (inorganic and microbiological) using proprietary and industry
standard protocols.
- Bacterial Enumeration
We developed and published the SEM Direct Count Method for bacterial enumeration.
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Typical Materials Analyzed Include:
- Ceramics
- Computer chips
- Filters
- Membranes
- Metals & Alloys
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- Paper
- Particulates in Water and Air
- Sediments
- Soils
- Other
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Equipment
- JEOL JSM840A Scanning Electron Microscope
- Kevex Delta Class Quantum Microanalyzer with Si(Li) Light Element Detector
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- Automatic Stage for Image Analysis
- Class 100 Clean Hood
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Deliverables
We can provide data interpretation services, as well as black and white
photomicrographs, spectral data, and x-ray mapping printouts of your samples. |
